![A vector map of the measured deflections of an atomic-sized electron beam scanned across different polar domains in the ferroelectric bismuth ferrite. The image was recorded in about a minute by the new electron microscope pixel array detector.](/-/media/bes/images/highlights/2016/06/electron-microscope-detector-large.jpg?h=768&w=556&la=en&hash=C6FFE8212072316F051AC40DBF1D4466DCE0BF475DB0FD993DF869FAEB03EC60)
New High-Capability Solid-State Electron Microscope Detector Enables Novel Studies of Materials
Device allows fast, precise measurements of electric and magnetic fields at the atomic level, providing insights into the next generation of electronic, energy production, and storage materials.